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Creators/Authors contains: "Adams, Daniel_E"

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  1. ; ; ; ; ; ; ; ; (, Optics Letters)
    Ultrafast laser pulse beams are four-dimensional, space–time phenomena that can exhibit complicated, coupled spatial and temporal profiles. Tailoring the spatiotemporal profile of an ultrafast pulse beam is necessary to optimize the focused intensity and to engineer exotic spatiotemporally shaped pulse beams. Here we demonstrate a single-pulse, reference-free spatiotemporal characterization technique based on two colocated synchronized measurements: (1) broadband single-shot ptychography and (2) single-shot frequency resolved optical gating. We apply the technique to measure the nonlinear propagation of an ultrafast pulse beam through a fused silica window. Our spatiotemporal characterization method represents a major contribution to the growing field of spatiotemporally engineered ultrafast laser pulse beams. 
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  2. ; ; ; ; ; ; ; ; ; (, Optica)
    High-intensity pulse-beams are ubiquitous in scientific investigations and industrial applications ranging from the generation of secondary radiation sources (e.g., high harmonic generation, electrons) to material processing (e.g., micromachining, laser-eye surgery). Crucially, pulse-beams can only be controlled to the degree to which they are characterized, necessitating sophisticated measurement techniques. We present a reference-free, full-field, single-shot spatiospectral measurement technique called broadband single-shot ptychography (BBSSP). BBSSP provides the complex wavefront for each spectral and polarization component in an ultrafast pulse-beam and should be applicable across the electromagnetic spectrum. BBSSP will dramatically improve the application and mitigation of spatiospectral pulse-beam structure. 
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  3. ; ; ; (, Optics Express)
    We present a phase retrieval algorithm for dispersion scan (d-scan), inspired by ptychography, which is capable of characterizing multiple mutually-incoherent ultrafast pulses (or modes) in a pulse train simultaneously from a single d-scan trace. In addition, a form of Newton’s method is employed as a solution to the square root problem commonly encountered in second harmonic pulse measurement techniques. Simulated and experimental phase retrievals of both single-mode and multi-mode d-scan traces are shown to demonstrate the accuracy and robustness of the root preserving ptychographic algorithm (RPPA). 
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  4. ; ; ; ; ; (, Optics Express)
    Ultrafast pulse-beam characterization is critical for diverse scientific and industrial applications from micromachining to generating the highest intensity laser pulses. The four-dimensional structure of a pulse-beam, E ~<#comment/> ( x , y , z , ω<#comment/> ) , can be fully characterized by coupling spatiospectral metrology with spectral phase measurement. When temporal pulse dynamics are not of primary interest, spatiospectral characterization of a pulse-beam provides crucial information even without spectral phase. Here we demonstrate spatiospectral characterization of pulse-beams via multiplexed broadband ptychography. The complex spatial profiles of multiple spectral components, E ~<#comment/> ( x , y , ω<#comment/> ) , from modelocked Ti:sapphire and from extreme ultra-violet pulse-beams are reconstructed with minimum intervening optics and no refocusing. Critically, our technique does not require spectral filters, interferometers, or reference pulses. 
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  5. ; ; ; ; ; ; ; (, Optics Express)
    Spatial frequency modulated imaging (SPIFI) enables the use of an extended excitation source for linear and nonlinear imaging with single element detection. To date, SPIFI has only been used with fixed excitation source geometries. Here, we explore the potential for the SPIFI method when a spatial light modulator (SLM) is used to program the excitation source, opening the door to a more versatile, random access imaging environment. In addition, an in-line, quantitative pulse compensation and measurement scheme is demonstrated using a new technique, spectral phase and amplitude retrieval and compensation (SPARC). This enables full characterization of the light exposure conditions at the focal plane of the random access imaging system, an important metric for optimizing, and reporting imaging conditions within specimens. 
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